Growth of a bismuth thin film on the five-fold surface of the icosahedral Ag-In-Yb quasicrystal

S. S. Hars, H. R. Sharma, J. A. Smerdon, S. Coates, K. Nozawa, A. P. Tsai, R. McGrath

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

We present a study of growth of quasicrystalline bismuth (Bi) thin films on the five-fold surface of the icosahedral Ag-In-Yb quasicrystal using scanning tunnelling microscopy (STM). The main building block of the Ag-In-Yb quasicrystal is a rhombic triacontahedral (RTH) cluster, which is formed by successive shells of atoms. The surface is formed at bulk planes which intersect the centres of the RTH clusters. We show that the deposited Bi atoms occupy vacant sites above the surface where the atoms of the RTH clusters would be and thus Bi grows with three-dimensional quasicrystalline order. Further deposition of Bi yields crystalline Bi islands aligned along high symmetry directions of the substrate.

Original languageEnglish
Pages (from-to)222-227
Number of pages6
JournalSurface Science
Volume678
DOIs
Publication statusPublished - 2018 Dec

Keywords

  • Bismuth
  • Quasicrystals
  • Scanning tunnelling microscopy
  • Surfaces
  • Thin films

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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