Growth of a bismuth thin film on the five-fold surface of the icosahedral Ag-In-Yb quasicrystal

S. S. Hars, H. R. Sharma, J. A. Smerdon, S. Coates, K. Nozawa, A. P. Tsai, R. McGrath

    Research output: Contribution to journalArticlepeer-review

    6 Citations (Scopus)

    Abstract

    We present a study of growth of quasicrystalline bismuth (Bi) thin films on the five-fold surface of the icosahedral Ag-In-Yb quasicrystal using scanning tunnelling microscopy (STM). The main building block of the Ag-In-Yb quasicrystal is a rhombic triacontahedral (RTH) cluster, which is formed by successive shells of atoms. The surface is formed at bulk planes which intersect the centres of the RTH clusters. We show that the deposited Bi atoms occupy vacant sites above the surface where the atoms of the RTH clusters would be and thus Bi grows with three-dimensional quasicrystalline order. Further deposition of Bi yields crystalline Bi islands aligned along high symmetry directions of the substrate.

    Original languageEnglish
    Pages (from-to)222-227
    Number of pages6
    JournalSurface Science
    Volume678
    DOIs
    Publication statusPublished - 2018 Dec

    Keywords

    • Bismuth
    • Quasicrystals
    • Scanning tunnelling microscopy
    • Surfaces
    • Thin films

    ASJC Scopus subject areas

    • Condensed Matter Physics
    • Surfaces and Interfaces
    • Surfaces, Coatings and Films
    • Materials Chemistry

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