Growth and characterization of ZnSe/BeTe superlattices

J. S. Song, J. H. Chang, M. W. Cho, Takashi Hanada, T. Yao

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

We have studied the growth and properties of ZnSe/BeTe superlattices by molecular beam epitaxy for two interface configurations, which are basically characterized by a "ZnTe" and a "BeSe" interface layer. The interface properties for the two interface configurations have been studied by means of reflection high energy electron diffraction, high resolution X-ray diffraction, and photoluminescence. It is shown that the optical and structural properties of ZnSe/ BeTe superlattices are improved with a ZnTe interface compared to a BeSe interface.

Original languageEnglish
Pages (from-to)104-108
Number of pages5
JournalJournal of Crystal Growth
Volume229
Issue number1
DOIs
Publication statusPublished - 2001 Jul 2

Keywords

  • A1. High resolution X-ray diffraction
  • A1. Interfaces
  • A3. Molecular beam epitaxy
  • A3. Superlattices
  • B2. Superconducting II-VI materials

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Inorganic Chemistry
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Growth and characterization of ZnSe/BeTe superlattices'. Together they form a unique fingerprint.

Cite this