Abstract
Glycinium oxalate (GOX) single crystals were grown by slow cooling solution growth method. The X-ray diffraction and Fourier transform infra red studies confirm the grown crystal. The hardness values of GOX are found to be higher than glycine. The increase in hardness may be due to the C-H---O bonding. The UV-Visible studies show that GOX crystals can be used for nonlinear applications. The dielectric measurement indicates that the GOX crystals have domains of varying sizes and varying relaxation time. The SHG output of GOX was 210 mV at given pulse energy of 5 mJ/s and KDP was 240 mV.
| Original language | English |
|---|---|
| Pages (from-to) | 2185-2188 |
| Number of pages | 4 |
| Journal | Materials Letters |
| Volume | 62 |
| Issue number | 14 |
| DOIs | |
| Publication status | Published - 2008 May 15 |
Keywords
- Crystal growth
- Dielectrics
- Hardness
- Optical materials and properties
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
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Cite this
Mythili, P., Kanagasekaran, T., & Gopalakrishnan, R. (2008). Growth and characterization of glycinium oxalate (GOX) single crystals. Materials Letters, 62(14), 2185-2188. https://doi.org/10.1016/j.matlet.2007.11.046