Growth and characterization of glycinium oxalate (GOX) single crystals

P. Mythili; T. Kanagasekaran; R. Gopalakrishnan

doi:10.1016/j.matlet.2007.11.046

Growth and characterization of glycinium oxalate (GOX) single crystals

P. Mythili, T. Kanagasekaran, R. Gopalakrishnan

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

Glycinium oxalate (GOX) single crystals were grown by slow cooling solution growth method. The X-ray diffraction and Fourier transform infra red studies confirm the grown crystal. The hardness values of GOX are found to be higher than glycine. The increase in hardness may be due to the C-H---O bonding. The UV-Visible studies show that GOX crystals can be used for nonlinear applications. The dielectric measurement indicates that the GOX crystals have domains of varying sizes and varying relaxation time. The SHG output of GOX was 210 mV at given pulse energy of 5 mJ/s and KDP was 240 mV.

Original language	English
Pages (from-to)	2185-2188
Number of pages	4
Journal	Materials Letters
Volume	62
Issue number	14
DOIs	https://doi.org/10.1016/j.matlet.2007.11.046
Publication status	Published - 2008 May 15
Externally published	Yes

Keywords

Crystal growth
Dielectrics
Hardness
Optical materials and properties

ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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10.1016/j.matlet.2007.11.046

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title = "Growth and characterization of glycinium oxalate (GOX) single crystals",

abstract = "Glycinium oxalate (GOX) single crystals were grown by slow cooling solution growth method. The X-ray diffraction and Fourier transform infra red studies confirm the grown crystal. The hardness values of GOX are found to be higher than glycine. The increase in hardness may be due to the C-H---O bonding. The UV-Visible studies show that GOX crystals can be used for nonlinear applications. The dielectric measurement indicates that the GOX crystals have domains of varying sizes and varying relaxation time. The SHG output of GOX was 210 mV at given pulse energy of 5 mJ/s and KDP was 240 mV.",

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author = "P. Mythili and T. Kanagasekaran and R. Gopalakrishnan",

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doi = "10.1016/j.matlet.2007.11.046",

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T1 - Growth and characterization of glycinium oxalate (GOX) single crystals

AU - Mythili, P.

AU - Kanagasekaran, T.

AU - Gopalakrishnan, R.

PY - 2008/5/15

Y1 - 2008/5/15

N2 - Glycinium oxalate (GOX) single crystals were grown by slow cooling solution growth method. The X-ray diffraction and Fourier transform infra red studies confirm the grown crystal. The hardness values of GOX are found to be higher than glycine. The increase in hardness may be due to the C-H---O bonding. The UV-Visible studies show that GOX crystals can be used for nonlinear applications. The dielectric measurement indicates that the GOX crystals have domains of varying sizes and varying relaxation time. The SHG output of GOX was 210 mV at given pulse energy of 5 mJ/s and KDP was 240 mV.

AB - Glycinium oxalate (GOX) single crystals were grown by slow cooling solution growth method. The X-ray diffraction and Fourier transform infra red studies confirm the grown crystal. The hardness values of GOX are found to be higher than glycine. The increase in hardness may be due to the C-H---O bonding. The UV-Visible studies show that GOX crystals can be used for nonlinear applications. The dielectric measurement indicates that the GOX crystals have domains of varying sizes and varying relaxation time. The SHG output of GOX was 210 mV at given pulse energy of 5 mJ/s and KDP was 240 mV.

KW - Crystal growth

KW - Dielectrics

KW - Hardness

KW - Optical materials and properties

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DO - 10.1016/j.matlet.2007.11.046

M3 - Article

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VL - 62

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EP - 2188

JO - Materials Letters

JF - Materials Letters

SN - 0167-577X

IS - 14

ER -

Growth and characterization of glycinium oxalate (GOX) single crystals

Abstract

Keywords

ASJC Scopus subject areas

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