Abstract
We have grown Ga1-xCrxN epilayer films with high Cr content up to 10.1% on ZnO templates. The c-axis lattice constant is systematically contracted with increasing Cr content according to high resolution X-ray diffraction measurement. We have observed the coexistence of ferromagnetic and paramagnetic components in Ga1-xCrxN. Magnetic measurements have shown that the paramagnetic component is increased with increasing Cr content.
Original language | English |
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Pages (from-to) | 2869-2873 |
Number of pages | 5 |
Journal | Physica Status Solidi C: Conferences |
Issue number | 7 |
DOIs | |
Publication status | Published - 2003 |
Event | 5th International Conference on Nitride Semiconductors, ICNS 2003 - Nara, Japan Duration: 2003 May 25 → 2003 May 30 |
ASJC Scopus subject areas
- Condensed Matter Physics