Group delay ripple reduction and reflectivity increase in a chirped fiber Bragg grating by multiple-overwriting of a phase mask with an electron-beam

Tetsuro Komukai; Tetsuro Inui; Masataka Nakazawa

doi:10.1109/68.853510

Group delay ripple reduction and reflectivity increase in a chirped fiber Bragg grating by multiple-overwriting of a phase mask with an electron-beam

Tetsuro Komukai, Tetsuro Inui, Masataka Nakazawa

Research output: Contribution to journal › Article › peer-review

18 Citations (Scopus)

Abstract

The phase errors in electron-beam-written step-chirped masks can be reduced by using a method based on the continuous movement approach and overwriting a pattern at the same place on the substrate several times. The group delay ripple of chirped fiber Bragg gratings fabricated by a four-times-overwritten phase mask is comparable with that of gratings obtained using a holographically written chirped phase mask.

Original language	English
Pages (from-to)	816-818
Number of pages	3
Journal	IEEE Photonics Technology Letters
Volume	12
Issue number	7
DOIs	https://doi.org/10.1109/68.853510
Publication status	Published - 2000 Jul
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering

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abstract = "The phase errors in electron-beam-written step-chirped masks can be reduced by using a method based on the continuous movement approach and overwriting a pattern at the same place on the substrate several times. The group delay ripple of chirped fiber Bragg gratings fabricated by a four-times-overwritten phase mask is comparable with that of gratings obtained using a holographically written chirped phase mask.",

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Group delay ripple reduction and reflectivity increase in a chirped fiber Bragg grating by multiple-overwriting of a phase mask with an electron-beam

Abstract

ASJC Scopus subject areas

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