Group delay ripple reduction and reflectivity increase in a chirped fiber Bragg grating by multiple-overwriting of a phase mask with an electron-beam

Tetsuro Komukai, Tetsuro Inui, Masataka Nakazawa

Research output: Contribution to journalArticlepeer-review

18 Citations (Scopus)

Abstract

The phase errors in electron-beam-written step-chirped masks can be reduced by using a method based on the continuous movement approach and overwriting a pattern at the same place on the substrate several times. The group delay ripple of chirped fiber Bragg gratings fabricated by a four-times-overwritten phase mask is comparable with that of gratings obtained using a holographically written chirped phase mask.

Original languageEnglish
Pages (from-to)816-818
Number of pages3
JournalIEEE Photonics Technology Letters
Volume12
Issue number7
DOIs
Publication statusPublished - 2000 Jul 1
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Group delay ripple reduction and reflectivity increase in a chirped fiber Bragg grating by multiple-overwriting of a phase mask with an electron-beam'. Together they form a unique fingerprint.

Cite this