Abstract
The phase errors in electron-beam-written step-chirped masks can be reduced by using a method based on the continuous movement approach and overwriting a pattern at the same place on the substrate several times. The group delay ripple of chirped fiber Bragg gratings fabricated by a four-times-overwritten phase mask is comparable with that of gratings obtained using a holographically written chirped phase mask.
Original language | English |
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Pages (from-to) | 816-818 |
Number of pages | 3 |
Journal | IEEE Photonics Technology Letters |
Volume | 12 |
Issue number | 7 |
DOIs | |
Publication status | Published - 2000 Jul 1 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering