Group delay ripple reduction and reflectivity increase in a chirped fiber Bragg grating by multiple-overwriting of a phase mask with an electron-beam

Tetsuro Komukai; Tetsuro Inui; Masataka Nakazawa

doi:10.1109/68.853510

Group delay ripple reduction and reflectivity increase in a chirped fiber Bragg grating by multiple-overwriting of a phase mask with an electron-beam

Tetsuro Komukai, Tetsuro Inui, Masataka Nakazawa

Research output: Contribution to journal › Article › peer-review

18 Citations (Scopus)

Abstract

The phase errors in electron-beam-written step-chirped masks can be reduced by using a method based on the continuous movement approach and overwriting a pattern at the same place on the substrate several times. The group delay ripple of chirped fiber Bragg gratings fabricated by a four-times-overwritten phase mask is comparable with that of gratings obtained using a holographically written chirped phase mask.

Original language	English
Pages (from-to)	816-818
Number of pages	3
Journal	IEEE Photonics Technology Letters
Volume	12
Issue number	7
DOIs	https://doi.org/10.1109/68.853510
Publication status	Published - 2000 Jul 1
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering

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@article{d33e38d6aafe4464853d25b582e55ed0,

title = "Group delay ripple reduction and reflectivity increase in a chirped fiber Bragg grating by multiple-overwriting of a phase mask with an electron-beam",

abstract = "The phase errors in electron-beam-written step-chirped masks can be reduced by using a method based on the continuous movement approach and overwriting a pattern at the same place on the substrate several times. The group delay ripple of chirped fiber Bragg gratings fabricated by a four-times-overwritten phase mask is comparable with that of gratings obtained using a holographically written chirped phase mask.",

author = "Tetsuro Komukai and Tetsuro Inui and Masataka Nakazawa",

year = "2000",

month = jul,

day = "1",

doi = "10.1109/68.853510",

language = "English",

volume = "12",

pages = "816--818",

journal = "IEEE Photonics Technology Letters",

issn = "1041-1135",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "7",

}

TY - JOUR

T1 - Group delay ripple reduction and reflectivity increase in a chirped fiber Bragg grating by multiple-overwriting of a phase mask with an electron-beam

AU - Komukai, Tetsuro

AU - Inui, Tetsuro

AU - Nakazawa, Masataka

PY - 2000/7/1

Y1 - 2000/7/1

N2 - The phase errors in electron-beam-written step-chirped masks can be reduced by using a method based on the continuous movement approach and overwriting a pattern at the same place on the substrate several times. The group delay ripple of chirped fiber Bragg gratings fabricated by a four-times-overwritten phase mask is comparable with that of gratings obtained using a holographically written chirped phase mask.

AB - The phase errors in electron-beam-written step-chirped masks can be reduced by using a method based on the continuous movement approach and overwriting a pattern at the same place on the substrate several times. The group delay ripple of chirped fiber Bragg gratings fabricated by a four-times-overwritten phase mask is comparable with that of gratings obtained using a holographically written chirped phase mask.

UR - http://www.scopus.com/inward/record.url?scp=0034229544&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0034229544&partnerID=8YFLogxK

U2 - 10.1109/68.853510

DO - 10.1109/68.853510

M3 - Article

AN - SCOPUS:0034229544

VL - 12

SP - 816

EP - 818

JO - IEEE Photonics Technology Letters

JF - IEEE Photonics Technology Letters

SN - 1041-1135

IS - 7

ER -