Tungsten (W) MIII X-ray absorption spectra of a periodic multilayer, (Si/W)100Si, were measured with the change of X-ray grazing angle using sample current method. Under not total reflection condition, the absorbance changed little except at W MIII absorption edge. While under the total reflection condition, the absorbance increased with the increase of the X-ray energy and the increment changed from low to high at the W MIII absorption edge. This result reflected the variation of the X-ray evanescent wavelength caused by the absorption effect of W.
ASJC Scopus subject areas
- Analytical Chemistry
- Atomic and Molecular Physics, and Optics