Abstract
Tungsten (W) MIII X-ray absorption spectra of a periodic multilayer, (Si/W)100Si, were measured with the change of X-ray grazing angle using sample current method. Under not total reflection condition, the absorbance changed little except at W MIII absorption edge. While under the total reflection condition, the absorbance increased with the increase of the X-ray energy and the increment changed from low to high at the W MIII absorption edge. This result reflected the variation of the X-ray evanescent wavelength caused by the absorption effect of W.
| Original language | English |
|---|---|
| Pages (from-to) | 223-226 |
| Number of pages | 4 |
| Journal | Spectrochimica acta, Part B: Atomic spectroscopy |
| Volume | 54 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 1999 Jan 4 |
ASJC Scopus subject areas
- Analytical Chemistry
- Atomic and Molecular Physics, and Optics
- Instrumentation
- Spectroscopy
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Hayashi, K., Amano, H., Yamamoto, T., Kawai, J., Kitajima, Y., & Takenaka, H. (1999). Grazing incidence X-ray absorption spectra of (Si/W)100/Si multilayer. Spectrochimica acta, Part B: Atomic spectroscopy, 54(1), 223-226. https://doi.org/10.1016/S0584-8547(98)00210-9