Grain rotation and lattice deformation during photoinduced chemical reactions revealed by in situ X-ray nanodiffraction

Zhifeng Huang, Matthias Bartels, Rui Xu, Markus Osterhoff, Sebastian Kalbfleisch, Michael Sprung, Akihiro Suzuki, Yukio Takahashi, Thomas N. Blanton, Tim Salditt, Jianwei Miao

Research output: Contribution to journalArticlepeer-review

15 Citations (Scopus)

Abstract

In situ X-ray diffraction (XRD) and transmission electron microscopy (TEM) have been used to investigate many physical science phenomena, ranging from phase transitions, chemical reactions and crystal growth to grain boundary dynamics. A major limitation of in situ XRD and TEM is a compromise that has to be made between spatial and temporal resolution. Here, we report the development of in situ X-ray nanodiffraction to measure high-resolution diffraction patterns from single grains with up to 5 ms temporal resolution. We observed, for the first time, grain rotation and lattice deformation in chemical reactions induced by X-ray photons: Br- + hv → Br + e- and e- + Ag+ → Ag0. The grain rotation and lattice deformation associated with the chemical reactions were quantified to be as fast as 3.25 rad s-1 and as large as 0.5 Å, respectively. The ability to measure high-resolution diffraction patterns from individual grains with a temporal resolution of several milliseconds is expected to find broad applications in materials science, physics, chemistry and nanoscience.

Original languageEnglish
Pages (from-to)691-695
Number of pages5
JournalNature Materials
Volume14
Issue number7
DOIs
Publication statusPublished - 2015 Jul 24
Externally publishedYes

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Fingerprint

Dive into the research topics of 'Grain rotation and lattice deformation during photoinduced chemical reactions revealed by in situ X-ray nanodiffraction'. Together they form a unique fingerprint.

Cite this