Grain boundary structure of c-BN thin film synthesized by PVD method

Wei Lie Zhou, Yuichi Ikuhara, Tetsuya Suzuki

    Research output: Contribution to journalArticle

    2 Citations (Scopus)

    Abstract

    Microstructure of cubic boron nitride (c-BN) films deposited on a Si substrate was investigated by transmission electron microscopy. The presence of cubic phase was clearly confirmed by taking the microdiffraction pattern and lattice image. Hexagonal boron nitride (/i-BN) with thickness 1-2 nm was often observed at the boundaries of c-BN films. The /i-BN phase at the boundary of the c-BN may be the reason of the high intrinsic compressive stress. It was suggested that the c-BN phase nucleated on the prism plane of /i-BN keeping the parallelism between the (111) c-BN and (0001) A-BN, although the slight deviation (~4°) was observed in some cases. The nucleation mechanism of c-BN was discussed analogous to that of diamond on graphite.

    Original languageEnglish
    Pages (from-to)1122-1126
    Number of pages5
    JournalMaterials Transactions, JIM
    Volume37
    Issue number5
    DOIs
    Publication statusPublished - 1996 Jan 1

    Keywords

    • Cubic boron nitride
    • Hexagonal boron nitride
    • High resolution electron microscopy
    • Ion plating method
    • Orientation relationship
    • Thin film

    ASJC Scopus subject areas

    • Engineering(all)

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