Grain boundary analysis and superplastic characteristics in GeO2-doped TZP

J. Mimurada, K. Sasaki, Y. Ikuhara, T. Sakuma

    Research output: Contribution to journalConference article

    4 Citations (Scopus)

    Abstract

    TEM observations in TZP-1 Ge were conducted, which has improved superplasticity when compared to 2.5Y-TZP. The TEM analysis consisted of high resolution electron microscopy (HREM) and energy dispersive X-ray spectroscopy (EDS) applied to grain boundaries in TZP-1Ge. HREM image revealed that there are no amorphous at multiple junctions or at grain boundaries. EDS profiles taken from the grain boundaries in TZP-1Ge show the segregation of Ge4+ at the boundaries. This segregation of Ge4+ is considered to be caused by the relaxation in strain energy. Consequently, the flow stress reduction in TZP-1Ge results from the enhanced diffusivity which controls the superplastic deformation by the presence of Ge4+ in zirconia. The comparison of the flow stress in Si4+, Ge4+ or Ti4+ doped Y-TZP suggests that the dopants existing inside zirconia grains affect the flow stress.

    Original languageEnglish
    Pages (from-to)383-388
    Number of pages6
    JournalKey Engineering Materials
    Volume171-174
    Publication statusPublished - 2000 Jan 1
    EventProceedings of the 1999 8th International Conference on Creep and Fracture of Engineering Materials and Structures - Tsukuba, Jpn
    Duration: 1999 Nov 11999 Nov 5

    ASJC Scopus subject areas

    • Materials Science(all)
    • Mechanics of Materials
    • Mechanical Engineering

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    Mimurada, J., Sasaki, K., Ikuhara, Y., & Sakuma, T. (2000). Grain boundary analysis and superplastic characteristics in GeO2-doped TZP. Key Engineering Materials, 171-174, 383-388.