Fundamental study on nano domain engineering using scanning nonlinear dielectric microscopy

K. Matsuura, Y. Cho, H. Odagawa

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

Scanning nonlinear dielectric microscopy (SNDM) is the first successful purely electrical method for observing the ferroelectric domain on the sub-nanometer order. As another high-resolution method for measuring ferroelectric domains, the piezoelectric response imaging method is often reported. In this study, it is confirmed that SNDM has a much higher resolution than piezoelectric imaging under the same experimental condition using the same system. First, the resolution of SNDM is described, and then, the resolution of SNDM is compared with that of piezoelectric imaging. Finally, a fundamental study for applying the SNDM system to a ferroelectric reading-recording system is performed, and it is concluded that SNDM has sufficient performance for application to the ferroelectric memory system.

Original languageEnglish
Pages (from-to)4354-4356
Number of pages3
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume40
Issue number6 B
DOIs
Publication statusPublished - 2001 Jun

Keywords

  • Concentration of electric field under the tip
  • Engineered small ferroelectric domains
  • Nonlinear dielectric response
  • Piezoelectric response
  • Scanning nonlinear dielectric microscopy

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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