Fundamental study on fault occurrence mechanisms by intentional electromagnetic interference using impulses

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

This paper investigates a mechanism of faulty outputs from cryptographic modules due to intentional electromagnetic interference (IEMI) which causes information leakage in electric devices without disrupting their functions or damaging their components. We show the mechanism of fault occurrence through experiments using the faulty ciphertexts and the pulse injection to the specific round. The experimental results indicate that faulty outputs from cryptographic modules are caused by setup-time violation to the cryptographic module.

Original languageEnglish
Title of host publication2015 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages585-588
Number of pages4
ISBN (Electronic)9781479966707
DOIs
Publication statusPublished - 2015 Aug 3
EventAsia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015 - Taipei, Taiwan, Province of China
Duration: 2015 May 252015 May 29

Publication series

Name2015 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015

Other

OtherAsia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015
Country/TerritoryTaiwan, Province of China
CityTaipei
Period15/5/2515/5/29

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Radiation

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