Fundamental study on dynamic nano-mechanical properties [IV] application for force modulation measurement [ii]

So Fujinami, Ken Nakajima, Toshio Nishi

    Research output: Contribution to conferencePaperpeer-review

    Abstract

    Force modulation measurement, in which the tip of AFM cantilever is continuously in contact with the sample surface and is forced to vibrate itself with lower frequency than its resonance, is commonly used to map the distribution of materials of composite systems. Though images obtained by this method are often interpreted as mapping of elasticity and viscosity, they give us merely qualitative information and might be affected by other factors than viscoelasticity. We measured force-distance curves in the condition of force modulation and obtained physical properties at each depth of the surface.

    Original languageEnglish
    Number of pages1
    Publication statusPublished - 2006 Dec 1
    Event55th Society of Polymer Science Japan Symposium on Macromolecules - Toyama, Japan
    Duration: 2006 Sep 202006 Sep 22

    Other

    Other55th Society of Polymer Science Japan Symposium on Macromolecules
    Country/TerritoryJapan
    CityToyama
    Period06/9/2006/9/22

    Keywords

    • Atomic force microscopy
    • Dynamic nano-mechanical properties
    • Force modulation measurement
    • Force-distance curve analysis
    • Viscoelastic properties

    ASJC Scopus subject areas

    • Engineering(all)

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