Fundamental study on dynamic nano-mechanical properties [III] application for force modulation measurement

So Fujinami, Ken Nakajima, Toshio Nishi

    Research output: Contribution to conferencePaperpeer-review

    Abstract

    Force modulation measurement, in which the tip of AFM cantilever is continuously in contact with the sample surface and is forced to vibrate itself with lower frequency than its resonance, is commonly used to map the distribution of materials of composite systems. Though images obtained by this method are often interpreted as mapping of elasticity and viscosity, they give us merely qualitative information and might be affected by other factors than viscoelastity. We measured force-distance curves in the condition of force modulation and obtained physical properties at each depth of the surface.

    Original languageEnglish
    Number of pages1
    Publication statusPublished - 2006 Oct 19
    Event55th SPSJ Annual Meeting - Nagoya, Japan
    Duration: 2006 May 242006 May 26

    Other

    Other55th SPSJ Annual Meeting
    CountryJapan
    CityNagoya
    Period06/5/2406/5/26

    Keywords

    • Atomic force microscopy
    • Dynamic nanomechanical properties
    • Force modulation measurement
    • Force-distance curve analysis
    • Viscoelastic properties

    ASJC Scopus subject areas

    • Engineering(all)

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