Abstract
Dynamic nano-mechanical measurement on polymeric surfaces will be reported, which is originally based on static force-distance curve analysis by atomic force microscopy. Viscoelastic properties will be revealed by this new method.
Original language | English |
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Number of pages | 1 |
Publication status | Published - 2006 Oct 19 |
Event | 55th SPSJ Annual Meeting - Nagoya, Japan Duration: 2006 May 24 → 2006 May 26 |
Other
Other | 55th SPSJ Annual Meeting |
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Country/Territory | Japan |
City | Nagoya |
Period | 06/5/24 → 06/5/26 |
Keywords
- Atomic force microscopy
- Dynamic nano-mechanical properties
- Elastic modulus image
- Force-distance curve analysis
- Sample deformation image
- Viscoelastic properties
ASJC Scopus subject areas
- Engineering(all)