Fundamental Study on a Mechanism of Faulty Outputs from Cryptographic Modules Due to IEMI

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Abstract

This paper investigates the mechanism underlying faulty outputs from cryptographic modules due to intentional electromagnetic interference (IEMI), which causes information leakage in electronic devices without disrupting their functions or damaging their components. We show this fault mechanism through experiments using the faulty ciphertexts and pulse injection to a specific round in the encryption process. The experimental results indicate that faulty outputs from cryptographic modules are caused by setup time violation in the cryptographic module.

Original languageEnglish
Pages (from-to)72-78
Number of pages7
JournalElectronics and Communications in Japan
Volume99
Issue number9
DOIs
Publication statusPublished - 2016 Sep 1

Keywords

  • Intentional electromagnetic interference
  • electromagnetic information leakage

ASJC Scopus subject areas

  • Signal Processing
  • Physics and Astronomy(all)
  • Computer Networks and Communications
  • Electrical and Electronic Engineering
  • Applied Mathematics

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