Fundamental study on a mechanism of faulty outputs from cryptographic modules due to IEMI

Research output: Contribution to journalArticlepeer-review

Abstract

This paper investigates a mechanism of faulty outputs from cryptographic modules due to intentional electromagnetic interference (IEMI) which causes information leakage in electric devices without disrupting their functions or damaging their components. We show the mechanism of fault occurrence through experiments using the faulty ciphertexts and the pulse injection to the specific round. The experimental results indicate that faulty outputs from cryptographic modules are caused by setup-time violation to the cryptographic module.

Original languageEnglish
Pages (from-to)276-281
Number of pages6
JournalIEEJ Transactions on Fundamentals and Materials
Volume135
Issue number5
DOIs
Publication statusPublished - 2015 May 1

Keywords

  • Electromagnetic information leakage
  • Intentional electromagnetic interference

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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