Fundamental study of surface layer on ferroelectrics by scanning nonlinear dielectric microscopy

K. Ohara, Y. Cho

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)

Abstract

Distribution and growth of very thin surface layers on ferroelectric materials are investigated by scanning nonlinear dielectric microscopy. This microscopy technique involves the measurement of higher order nonlinear dielectric constants, with depth resolution down to one unit cell order. By changing the order of nonlinearity of the dielectric response, we obtain information about the surface layer on lead zirconate titanate (PZT) thin film and also observe the growth process of a surface paraelectric layer on LiNhO3 single crystal.

Original languageEnglish
Pages (from-to)5833-5836
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume40
Issue number9 B
DOIs
Publication statusPublished - 2001 Sep

Keywords

  • Nonlinear dielectric constant
  • Scanning nonlinear dielectric microscopy
  • Scanning probe microscopy
  • Surface layer

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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