Abstract
Distribution and growth of very thin surface layers on ferroelectric materials are investigated by scanning nonlinear dielectric microscopy. This microscopy technique involves the measurement of higher order nonlinear dielectric constants, with depth resolution down to one unit cell order. By changing the order of nonlinearity of the dielectric response, we obtain information about the surface layer on lead zirconate titanate (PZT) thin film and also observe the growth process of a surface paraelectric layer on LiNhO3 single crystal.
| Original language | English |
|---|---|
| Pages (from-to) | 5833-5836 |
| Number of pages | 4 |
| Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
| Volume | 40 |
| Issue number | 9 B |
| DOIs | |
| Publication status | Published - 2001 Sep |
Keywords
- Nonlinear dielectric constant
- Scanning nonlinear dielectric microscopy
- Scanning probe microscopy
- Surface layer
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)