Functional probes for scanning probe microscopy

K. Akiyama, T. Eguchi, T. An, Y. Fujikawa, Toshio Sakurai, Y. Hasegawa

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

Functional probes such as a metal-tip cantilever and a glass-coated tungsten tip for scanning probe microscopy (SPM) were fabricated utilizing focused ion beam method. Using the functional probes, we obtained results which were hard to reach by usual SPM probes.

Original languageEnglish
Article number005
Pages (from-to)22-25
Number of pages4
JournalJournal of Physics: Conference Series
Volume61
Issue number1
DOIs
Publication statusPublished - 2007 Apr 1

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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