Functional probes for scanning probe microscopy

K. Akiyama; T. Eguchi; T. An; Y. Fujikawa; T. Sakurai; Y. Hasegawa

doi:10.1088/1742-6596/61/1/005

Functional probes for scanning probe microscopy

K. Akiyama, T. Eguchi, T. An, Y. Fujikawa, T. Sakurai, Y. Hasegawa

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

Functional probes such as a metal-tip cantilever and a glass-coated tungsten tip for scanning probe microscopy (SPM) were fabricated utilizing focused ion beam method. Using the functional probes, we obtained results which were hard to reach by usual SPM probes.

Original language	English
Article number	005
Pages (from-to)	22-25
Number of pages	4
Journal	Journal of Physics: Conference Series
Volume	61
Issue number	1
DOIs	https://doi.org/10.1088/1742-6596/61/1/005
Publication status	Published - 2007 Apr 1
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy(all)

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10.1088/1742-6596/61/1/005

Cite this

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title = "Functional probes for scanning probe microscopy",

abstract = "Functional probes such as a metal-tip cantilever and a glass-coated tungsten tip for scanning probe microscopy (SPM) were fabricated utilizing focused ion beam method. Using the functional probes, we obtained results which were hard to reach by usual SPM probes.",

author = "K. Akiyama and T. Eguchi and T. An and Y. Fujikawa and T. Sakurai and Y. Hasegawa",

year = "2007",

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T1 - Functional probes for scanning probe microscopy

AU - Akiyama, K.

AU - Eguchi, T.

AU - An, T.

AU - Fujikawa, Y.

AU - Sakurai, T.

AU - Hasegawa, Y.

PY - 2007/4/1

Y1 - 2007/4/1

N2 - Functional probes such as a metal-tip cantilever and a glass-coated tungsten tip for scanning probe microscopy (SPM) were fabricated utilizing focused ion beam method. Using the functional probes, we obtained results which were hard to reach by usual SPM probes.

AB - Functional probes such as a metal-tip cantilever and a glass-coated tungsten tip for scanning probe microscopy (SPM) were fabricated utilizing focused ion beam method. Using the functional probes, we obtained results which were hard to reach by usual SPM probes.

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AN - SCOPUS:34247495230

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JO - Journal of Physics: Conference Series

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Functional probes for scanning probe microscopy

Abstract

ASJC Scopus subject areas

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