Fully automatic thin film permeameter

Shin Yabukami, Masahiro Yamaguchi, K. I. Arai, H. Ando, A. Itagaki, M. Watanabe

Research output: Contribution to journalConference articlepeer-review

3 Citations (Scopus)


A high-speed, fully-automatic, broad-bandwidth thin film permeameter was developed to account for magnetic films used in high frequency magnetic devices. Automatic measurements were realized through extensive investigations on automatic calibration procedure to obtain an absolute permeance value, interference between electric equipment and jig of permeameter, and noise reduction inside the jig.

Original languageEnglish
JournalDigests of the Intermag Conference
Publication statusPublished - 1999 Dec 1
EventProceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' - Kyongju, South Korea
Duration: 1999 May 181999 May 21

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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