Fully automatic thin film permeameter

S. Yabukami, M. Yamaguchi, K. I. Arai, H. Ando, A. Itagaki, M. Watanabe

Research output: Contribution to journalConference articlepeer-review

3 Citations (Scopus)

Abstract

A high-speed, fully-automatic, broad-bandwidth thin film permeameter was developed to account for magnetic films used in high frequency magnetic devices. Automatic measurements were realized through extensive investigations on automatic calibration procedure to obtain an absolute permeance value, interference between electric equipment and jig of permeameter, and noise reduction inside the jig.

Original languageEnglish
Pages (from-to)AQ-02
JournalDigests of the Intermag Conference
DOIs
Publication statusPublished - 1999
EventProceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' - Kyongju, South Korea
Duration: 1999 May 181999 May 21

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Fully automatic thin film permeameter'. Together they form a unique fingerprint.

Cite this