Full-field x-ray fluorescence imaging microscope with a Wolter mirror

Akihisa Takeuchi; Sadao Aoki; Kimitake Yamamoto; Hidekazu Takano; Norio Watanabe; Masami Ando

doi:10.1063/1.1150454

Full-field x-ray fluorescence imaging microscope with a Wolter mirror

Akihisa Takeuchi, Sadao Aoki, Kimitake Yamamoto, Hidekazu Takano, Norio Watanabe, Masami Ando

Research output: Contribution to journal › Article › peer-review

18 Citations (Scopus)

Abstract

Full-field x-ray fluorescence (XRF) and transmission x-ray microscopic images were obtained with a Wolter-type mirror (10× magnification). A synchrotron radiation white beam (4-20 keV) from a bending magnet beamline at the Photon Factory was used to obtain XRF images and a conventional laboratory x-ray source (8.04 keV) was used to obtain transmission x-ray images. The effects of the coherent and the incoherent scattering x rays on the contrast of an XRF image were estimated. The scattering angle between the incidence x ray and the optical axis of the XRF microscope should be 90° to obtain the highest contrast image when the incidence x ray is horizontally polarized. Observation of small metallic inclusions in the synthesized diamond showed that the contrast of the XRF image was better than that of the transmission x-ray image.

Original language	English
Pages (from-to)	1279-1285
Number of pages	7
Journal	Review of Scientific Instruments
Volume	71
Issue number	3
DOIs	https://doi.org/10.1063/1.1150454
Publication status	Published - 2000 Mar
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

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@article{079b902dc9bd438b9512a65aa81187df,

title = "Full-field x-ray fluorescence imaging microscope with a Wolter mirror",

abstract = "Full-field x-ray fluorescence (XRF) and transmission x-ray microscopic images were obtained with a Wolter-type mirror (10× magnification). A synchrotron radiation white beam (4-20 keV) from a bending magnet beamline at the Photon Factory was used to obtain XRF images and a conventional laboratory x-ray source (8.04 keV) was used to obtain transmission x-ray images. The effects of the coherent and the incoherent scattering x rays on the contrast of an XRF image were estimated. The scattering angle between the incidence x ray and the optical axis of the XRF microscope should be 90° to obtain the highest contrast image when the incidence x ray is horizontally polarized. Observation of small metallic inclusions in the synthesized diamond showed that the contrast of the XRF image was better than that of the transmission x-ray image.",

author = "Akihisa Takeuchi and Sadao Aoki and Kimitake Yamamoto and Hidekazu Takano and Norio Watanabe and Masami Ando",

year = "2000",

month = mar,

doi = "10.1063/1.1150454",

language = "English",

volume = "71",

pages = "1279--1285",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics Publising LLC",

number = "3",

}

TY - JOUR

T1 - Full-field x-ray fluorescence imaging microscope with a Wolter mirror

AU - Takeuchi, Akihisa

AU - Aoki, Sadao

AU - Yamamoto, Kimitake

AU - Takano, Hidekazu

AU - Watanabe, Norio

AU - Ando, Masami

PY - 2000/3

Y1 - 2000/3

N2 - Full-field x-ray fluorescence (XRF) and transmission x-ray microscopic images were obtained with a Wolter-type mirror (10× magnification). A synchrotron radiation white beam (4-20 keV) from a bending magnet beamline at the Photon Factory was used to obtain XRF images and a conventional laboratory x-ray source (8.04 keV) was used to obtain transmission x-ray images. The effects of the coherent and the incoherent scattering x rays on the contrast of an XRF image were estimated. The scattering angle between the incidence x ray and the optical axis of the XRF microscope should be 90° to obtain the highest contrast image when the incidence x ray is horizontally polarized. Observation of small metallic inclusions in the synthesized diamond showed that the contrast of the XRF image was better than that of the transmission x-ray image.

AB - Full-field x-ray fluorescence (XRF) and transmission x-ray microscopic images were obtained with a Wolter-type mirror (10× magnification). A synchrotron radiation white beam (4-20 keV) from a bending magnet beamline at the Photon Factory was used to obtain XRF images and a conventional laboratory x-ray source (8.04 keV) was used to obtain transmission x-ray images. The effects of the coherent and the incoherent scattering x rays on the contrast of an XRF image were estimated. The scattering angle between the incidence x ray and the optical axis of the XRF microscope should be 90° to obtain the highest contrast image when the incidence x ray is horizontally polarized. Observation of small metallic inclusions in the synthesized diamond showed that the contrast of the XRF image was better than that of the transmission x-ray image.

UR - http://www.scopus.com/inward/record.url?scp=0001150681&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0001150681&partnerID=8YFLogxK

U2 - 10.1063/1.1150454

DO - 10.1063/1.1150454

M3 - Article

AN - SCOPUS:0001150681

VL - 71

SP - 1279

EP - 1285

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 3

ER -