Full-field x-ray fluorescence imaging microscope with a Wolter mirror

Akihisa Takeuchi, Sadao Aoki, Kimitake Yamamoto, Hidekazu Takano, Norio Watanabe, Masami Ando

Research output: Contribution to journalArticlepeer-review

18 Citations (Scopus)

Abstract

Full-field x-ray fluorescence (XRF) and transmission x-ray microscopic images were obtained with a Wolter-type mirror (10× magnification). A synchrotron radiation white beam (4-20 keV) from a bending magnet beamline at the Photon Factory was used to obtain XRF images and a conventional laboratory x-ray source (8.04 keV) was used to obtain transmission x-ray images. The effects of the coherent and the incoherent scattering x rays on the contrast of an XRF image were estimated. The scattering angle between the incidence x ray and the optical axis of the XRF microscope should be 90° to obtain the highest contrast image when the incidence x ray is horizontally polarized. Observation of small metallic inclusions in the synthesized diamond showed that the contrast of the XRF image was better than that of the transmission x-ray image.

Original languageEnglish
Pages (from-to)1279-1285
Number of pages7
JournalReview of Scientific Instruments
Volume71
Issue number3
DOIs
Publication statusPublished - 2000 Mar
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

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