Abstract
Full-field x-ray fluorescence (XRF) and transmission x-ray microscopic images were obtained with a Wolter-type mirror (10× magnification). A synchrotron radiation white beam (4-20 keV) from a bending magnet beamline at the Photon Factory was used to obtain XRF images and a conventional laboratory x-ray source (8.04 keV) was used to obtain transmission x-ray images. The effects of the coherent and the incoherent scattering x rays on the contrast of an XRF image were estimated. The scattering angle between the incidence x ray and the optical axis of the XRF microscope should be 90° to obtain the highest contrast image when the incidence x ray is horizontally polarized. Observation of small metallic inclusions in the synthesized diamond showed that the contrast of the XRF image was better than that of the transmission x-ray image.
Original language | English |
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Pages (from-to) | 1279-1285 |
Number of pages | 7 |
Journal | Review of Scientific Instruments |
Volume | 71 |
Issue number | 3 |
DOIs | |
Publication status | Published - 2000 Mar |
Externally published | Yes |
ASJC Scopus subject areas
- Instrumentation