Frustration of direct photoionization of Ar clusters in intense extreme ultraviolet pulses from a free electron laser

H. Iwayama, K. Nagaya, M. Yao, H. Fukuzawa, X. J. Liu, G. Prümper, M. Okunishi, K. Shimada, K. Ueda, T. Harada, M. Toyoda, Mihiro Yanagihara, M. Yamamoto, K. Motomura, N. Saito, A. Rudenko, J. Ullrich, L. Foucar, A. Czasch, R. DörnerM. Nagasono, A. Higashiya, M. Yabashi, T. Ishikawa, H. Ohashi, H. Kimura

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37 Citations (Scopus)

Abstract

We have measured the kinetic energies of fragment ions from Ar clusters (average cluster size 〈N〉∼ 10-600) exposed to intense extreme ultraviolet free electron laser pulses (λ ∼ 61 nm, I∼ 1.3× 1011 W cm-2). For small clusters (〈N〉≲ 200), the average kinetic energy of ions strongly increases with increasing the cluster size, indicating a promotion of the multiple ionization, whereas the average kinetic energy is observed to be saturated for 〈N〉≳ 200. Considering how many photoelectrons can escape from the cluster, it was found that the size dependence of the ion kinetic energy exhibited the frustration of direct photoionization, which resulted from the strong Coulomb potential of the highly ionized cluster.

Original languageEnglish
Article number134019
JournalJournal of Physics B: Atomic, Molecular and Optical Physics
Volume42
Issue number13
DOIs
Publication statusPublished - 2009 Nov 9

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics

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