Formation of (W,V)Cx layers at the WC/Co interfaces in the VC-doped WC-Co cemented carbide

I. Sugiyama, Y. Mizumukai, T. Taniuchi, K. Okada, F. Shirase, T. Tanase, Yuichi Ikuhara, T. Yamamoto

    Research output: Contribution to journalArticle

    25 Citations (Scopus)

    Abstract

    The (W,V)Cx thin layers at the WC/Co interfaces in the oil-quenched WC-12mass%Co-0.5mass%VC hard metal were investigated by high resolution transmission electron microscopy. The (W,V)Cx thin layers are formed on the liquid phase sintering state, because they are observed on the micro-facets and some of them are included inside the WC grains. The grain growth rate strongly depends on whether the thickness of the (W,V)Cx layers is more than one layer or less during liquid-phase sintering.

    Original languageEnglish
    Pages (from-to)185-187
    Number of pages3
    JournalInternational Journal of Refractory Metals and Hard Materials
    Volume30
    Issue number1
    DOIs
    Publication statusPublished - 2012 Jan 1

    Keywords

    • Cemented carbides
    • Cermets
    • Hard metals
    • Transmission electron microscope (TEM)
    • WC-Co
    • X-ray energy dispersive spectroscopy (EDS)

    ASJC Scopus subject areas

    • Ceramics and Composites
    • Mechanics of Materials
    • Mechanical Engineering
    • Metals and Alloys
    • Materials Chemistry

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