TY - JOUR
T1 - Formation of polar phase in Fe-doped ZrO 2 epitaxial thin films
AU - Choi, S.
AU - Shiraishi, T.
AU - Kiguchi, T.
AU - Shimizu, T.
AU - Funakubo, H.
AU - Konno, T. J.
N1 - Funding Information:
This research was supported by Japan Society for the Promotion of Science (JSPS) KAKENHI Grant Nos. 17J03160, 16K18231, 16K14378, 16K14380, and 16H00882. A part of this work was also supported by the Izumi Science and Technology Foundation. Also, the support for XPS by K. Ohmura in Cooperative Research and Development Center for Advanced Materials in IMR is acknowledged.
Publisher Copyright:
© 2018 Author(s).
PY - 2018/12/24
Y1 - 2018/12/24
N2 - The existence of a polar phase in epitaxially grown Fe-doped ZrO 2 thin films has been demonstrated. The films were prepared on yttria-stabilized zirconia substrates by ion-beam sputtering and subsequent annealing, where the composition was controlled by changing the FeO 1.5 -ZrO 2 ratio of the sputtering target. The chemical states of elements in the 30 nm-thick xFeO 1.5 -(1-x)ZrO 2 thin films (x = 0, 0.06, 0.10, and 0.14 nominal composition) have been measured by X-ray photoelectron spectroscopy, and the crystal structure has been examined by using X-ray diffraction and scanning transmission electron microscopy. These observations revealed that the undoped ZrO 2 thin film (x = 0) is dominated by the monoclinic phase (space group: P2 1 /c), while the films containing Fe exhibit multi-domain structures consisting of monoclinic and orthorhombic (Pbc2 1 ) phases, the latter being a polar phase, showing that the orthorhombic phase is stabilized by the addition of Fe. Concurrently, the polarization-electric field loops of the Fe-doped films exhibited hysteresis for the film with x = 0.06.
AB - The existence of a polar phase in epitaxially grown Fe-doped ZrO 2 thin films has been demonstrated. The films were prepared on yttria-stabilized zirconia substrates by ion-beam sputtering and subsequent annealing, where the composition was controlled by changing the FeO 1.5 -ZrO 2 ratio of the sputtering target. The chemical states of elements in the 30 nm-thick xFeO 1.5 -(1-x)ZrO 2 thin films (x = 0, 0.06, 0.10, and 0.14 nominal composition) have been measured by X-ray photoelectron spectroscopy, and the crystal structure has been examined by using X-ray diffraction and scanning transmission electron microscopy. These observations revealed that the undoped ZrO 2 thin film (x = 0) is dominated by the monoclinic phase (space group: P2 1 /c), while the films containing Fe exhibit multi-domain structures consisting of monoclinic and orthorhombic (Pbc2 1 ) phases, the latter being a polar phase, showing that the orthorhombic phase is stabilized by the addition of Fe. Concurrently, the polarization-electric field loops of the Fe-doped films exhibited hysteresis for the film with x = 0.06.
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U2 - 10.1063/1.5063757
DO - 10.1063/1.5063757
M3 - Article
AN - SCOPUS:85059505667
VL - 113
JO - Applied Physics Letters
JF - Applied Physics Letters
SN - 0003-6951
IS - 26
M1 - 262903
ER -