Formation mechanism of grain boundaries in YBa2Cu3O7-y superconducting thick film by liquid phase epitaxy

T. Kitamura, J. G. Wen, Y. Shiohara, N. Koshizuka, I. Hirabayashi, S. Tanaka, Y. Sugawara, Y. Ikuhara

    Research output: Contribution to journalArticlepeer-review

    4 Citations (Scopus)

    Abstract

    Superconducting YBa2Cu3O7-y thick films were fabricated by liquid phase epitaxy (LPE) on the MgO (100) single crystalline substrate. The transport superconducting characteristics of the films depend on the crystalline in-plane alignment of the film. The basal plane grain boundaries with large tilted angle of 36° and 45° were found by transmission electron microscope observation in the film of the low critical current density. The large tilt angle grain boundaries behave as a resistive type grain boundary and lower transport Jc of the YBCO film. These boundaries were formed by the coalescence of island grown YBCO layer due to the multi-nucleation and growth mode of the hetero-epitaxial growth on the MgO (100) substrate.

    Original languageEnglish
    Pages (from-to)120-126
    Number of pages7
    JournalPhysica C: Superconductivity and its applications
    Volume262
    Issue number1-2
    DOIs
    Publication statusPublished - 1996 May 10

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Energy Engineering and Power Technology
    • Electrical and Electronic Engineering

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