Foreword :Scanning probe microscopy

Takuji Takahashi; Masami Kageshima; Ken Nakajima; Ken Ichi Fukui; Tadahiro Komeda; Koji Sumitomo; Takayuki Uchihashi; Tomonobu Nakayama

doi:10.7567/JJAP.55.08N001

Foreword :Scanning probe microscopy

Takuji Takahashi, Masami Kageshima, Ken Nakajima, Ken Ichi Fukui, Tadahiro Komeda, Koji Sumitomo, Takayuki Uchihashi, Tomonobu Nakayama

Center for Advanced Microscopy and Spectroscopy

Research output: Contribution to journal › Editorial

Original language	English
Article number	08N001
Journal	Japanese journal of applied physics
Volume	55
Issue number	8
DOIs	https://doi.org/10.7567/JJAP.55.08N001
Publication status	Published - 2016 Aug

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

Access to Document

10.7567/JJAP.55.08N001

Cite this

Takahashi, T., Kageshima, M., Nakajima, K., Fukui, K. I., Komeda, T., Sumitomo, K., Uchihashi, T., & Nakayama, T. (2016). Foreword :Scanning probe microscopy. Japanese journal of applied physics, 55(8), [08N001]. https://doi.org/10.7567/JJAP.55.08N001

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AU - Sumitomo, Koji

AU - Uchihashi, Takayuki

AU - Nakayama, Tomonobu

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