Foreword :Scanning probe microscopy

Takuji Takahashi, Masami Kageshima, Ken Nakajima, Ken Ichi Fukui, Tadahiro Komeda, Koji Sumitomo, Takayuki Uchihashi, Tomonobu Nakayama

Research output: Contribution to journalEditorial

Original languageEnglish
Article number08N001
JournalJapanese journal of applied physics
Volume55
Issue number8
DOIs
Publication statusPublished - 2016 Aug

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Takahashi, T., Kageshima, M., Nakajima, K., Fukui, K. I., Komeda, T., Sumitomo, K., Uchihashi, T., & Nakayama, T. (2016). Foreword :Scanning probe microscopy. Japanese journal of applied physics, 55(8), [08N001]. https://doi.org/10.7567/JJAP.55.08N001