Fluxional behavior of alkoxy-bridged bis(silylene)ruthenium complexes Cp*Me3PRu{SiMe2...O(R)...SiMe2} (R = Me, tBu) caused by rotation of the silylene ligands

Hiroaki Wada, Hiromi Tobita, Hiroshi Ogino

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)

Abstract

The exchange of Si-Me groups caused by silylene ligand rotation in alkoxy-bridged bis(silylene)complexes Cp*(Me3P)Ru{SiMe2...O(R)...SiMe2} (R = Me, tBu) is observed by the variable temperature 1H NMR (VT 1H NMR) spectroscopy. This fluxionality is considered to be due to the weakened Si...O partial bonds caused by the strong electron-releasing effect of Cp* and PMe3 ligands.

Original languageEnglish
Pages (from-to)993-994
Number of pages2
JournalChemistry Letters
Issue number10
DOIs
Publication statusPublished - 1998 Jan 1

ASJC Scopus subject areas

  • Chemistry(all)

Fingerprint

Dive into the research topics of 'Fluxional behavior of alkoxy-bridged bis(silylene)ruthenium complexes Cp*Me<sub>3</sub>PRu{SiMe<sub>2</sub>...O(R)...SiMe<sub>2</sub>} (R = Me, <sup>t</sup>Bu) caused by rotation of the silylene ligands'. Together they form a unique fingerprint.

Cite this