Abstract
Memory properties of a nanodot-type floating gate memory with Co-bio-nanodots (Co-BNDs) embedded in HfO2 were investigated. High density and uniform Co-BNDs were adsorbed on a HfO2 tunnel oxide using ferritin. The fabricated MOS capacitor exhibited a capacitance-voltage curve with large hysteresis. The memory window size was 30 times larger than that of the MOS capacitor with an SiO2 gate oxide. Not only a large memory window but also excellent charge retention and reliability characteristics were obtained for an MOS field-effect transistor. The high-performance nanodot-type floating gate memory was first fabricated at low temperature by utilizing supramolecular protein.
Original language | English |
---|---|
Article number | 5491186 |
Pages (from-to) | 576-581 |
Number of pages | 6 |
Journal | IEEE Transactions on Nanotechnology |
Volume | 10 |
Issue number | 3 |
DOIs | |
Publication status | Published - 2011 May |
Keywords
- Bio-nano process
- MOS devices
- ferritin
- floating gate memory
- high-$k$
ASJC Scopus subject areas
- Computer Science Applications
- Electrical and Electronic Engineering