Field ion-scanning tunneling microscopy

T. Sakurai, T. Hashizume, I. Kamiya, Y. Hasegawa, N. Sano, H. W. Pickering, A. Sakai

    Research output: Contribution to journalArticle

    154 Citations (Scopus)

    Abstract

    A scanning tunneling microscope combined with a field ion microscope, which we call "FI-STM" has been constructed and tested successfully. The details of the principles and performance of the FI-STM are described. Several examples of its applications for Si (111) and Si (100) surfaces are presented as illustrations of the power of the instrument.

    Original languageEnglish
    Pages (from-to)3-89
    Number of pages87
    JournalProgress in Surface Science
    Volume33
    Issue number1
    DOIs
    Publication statusPublished - 1990

    ASJC Scopus subject areas

    • Chemistry(all)
    • Condensed Matter Physics
    • Surfaces and Interfaces
    • Surfaces, Coatings and Films

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  • Cite this

    Sakurai, T., Hashizume, T., Kamiya, I., Hasegawa, Y., Sano, N., Pickering, H. W., & Sakai, A. (1990). Field ion-scanning tunneling microscopy. Progress in Surface Science, 33(1), 3-89. https://doi.org/10.1016/0079-6816(90)90012-9