Field emission from atomically thin edges of reduced graphene oxide

Hisato Yamaguchi, Katsuhisa Murakami, Goki Eda, Takeshi Fujita, Pengfei Guan, Weichao Wang, Cheng Gong, Julien Boisse, Steve Miller, Muge Acik, Kyeongjae Cho, Yves J. Chabal, Mingwei Chen, Fujio Wakaya, Mikio Takai, Manish Chhowalla

Research output: Contribution to journalArticlepeer-review

128 Citations (Scopus)


Point sources exhibit low threshold electron emission due to local field enhancement at the tip. The development and implementation of tip emitters have been hampered by the need to position them sufficiently apart to achieve field enhancement, limiting the number of emission sites and therefore the overall current. Here we report low threshold field (< 0.1 V/μm) emission of multiple electron beams from atomically thin edges of reduced graphene oxide (rGO). Field emission microscopy measurements show evidence for interference from emission sites that are separated by a few nanometers, suggesting that the emitted electron beams are coherent. On the basis of our high-resolution transmission electron microscopy, infrared spectroscopy, and simulation results, field emission from the rGO edge is attributed to a stable and unique aggregation of oxygen groups in the form of cyclic edge ethers. Such closely spaced electron beams from rGO offer prospects for novel applications and understanding the physics of linear electron sources.

Original languageEnglish
Pages (from-to)4945-4952
Number of pages8
JournalACS Nano
Issue number6
Publication statusPublished - 2011 Jun 28


  • atomically thin edge
  • chemically derived grapheme
  • field electron emission
  • field emission pattern
  • interference
  • low threshold field
  • reduced graphene oxide

ASJC Scopus subject areas

  • Materials Science(all)
  • Engineering(all)
  • Physics and Astronomy(all)


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