Abstract
The accuracy of data obtained by field-ion microscopy is often limited by a ± 15% uncertainty of converting measured voltages into field strengths. Plotting the difference of relative energy deficits of free-space ionized H2, D2, or Kr for sets of two applied voltages against the logarithm of the voltage ratios yields a field factor k. The surface field F0=Vkrt is obtained with the 3% accuracy by which the tip radius rt can be known. The method is applicable to all metals accessible to field-ion-microscopy.
Original language | English |
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Pages (from-to) | 532-535 |
Number of pages | 4 |
Journal | Physical Review Letters |
Volume | 30 |
Issue number | 12 |
DOIs | |
Publication status | Published - 1973 |
ASJC Scopus subject areas
- Physics and Astronomy(all)