Field calibration using the energy distribution of field ionization

Toshio Sakurai, Erwin W. Müller

    Research output: Contribution to journalArticlepeer-review

    63 Citations (Scopus)

    Abstract

    The accuracy of data obtained by field-ion microscopy is often limited by a ± 15% uncertainty of converting measured voltages into field strengths. Plotting the difference of relative energy deficits of free-space ionized H2, D2, or Kr for sets of two applied voltages against the logarithm of the voltage ratios yields a field factor k. The surface field F0=Vkrt is obtained with the 3% accuracy by which the tip radius rt can be known. The method is applicable to all metals accessible to field-ion-microscopy.

    Original languageEnglish
    Pages (from-to)532-535
    Number of pages4
    JournalPhysical Review Letters
    Volume30
    Issue number12
    DOIs
    Publication statusPublished - 1973

    ASJC Scopus subject areas

    • Physics and Astronomy(all)

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