Field calibration using the energy distribution of field ionization

Toshio Sakurai; Erwin W. Müller

doi:10.1103/PhysRevLett.30.532

Field calibration using the energy distribution of field ionization

Toshio Sakurai, Erwin W. Müller

Research output: Contribution to journal › Article › peer-review

65 Citations (Scopus)

Abstract

The accuracy of data obtained by field-ion microscopy is often limited by a ± 15% uncertainty of converting measured voltages into field strengths. Plotting the difference of relative energy deficits of free-space ionized H2, D2, or Kr for sets of two applied voltages against the logarithm of the voltage ratios yields a field factor k. The surface field F0=Vkrt is obtained with the 3% accuracy by which the tip radius rt can be known. The method is applicable to all metals accessible to field-ion-microscopy.

Original language	English
Pages (from-to)	532-535
Number of pages	4
Journal	Physical Review Letters
Volume	30
Issue number	12
DOIs	https://doi.org/10.1103/PhysRevLett.30.532
Publication status	Published - 1973

ASJC Scopus subject areas

Physics and Astronomy(all)

Access to Document

10.1103/PhysRevLett.30.532

Cite this

@article{f4efc4e6fbf74203ab91deb5ffa44c76,

title = "Field calibration using the energy distribution of field ionization",

abstract = "The accuracy of data obtained by field-ion microscopy is often limited by a ± 15% uncertainty of converting measured voltages into field strengths. Plotting the difference of relative energy deficits of free-space ionized H2, D2, or Kr for sets of two applied voltages against the logarithm of the voltage ratios yields a field factor k. The surface field F0=Vkrt is obtained with the 3% accuracy by which the tip radius rt can be known. The method is applicable to all metals accessible to field-ion-microscopy.",

author = "Toshio Sakurai and M{\"u}ller, {Erwin W.}",

year = "1973",

doi = "10.1103/PhysRevLett.30.532",

language = "English",

volume = "30",

pages = "532--535",

journal = "Physical Review Letters",

issn = "0031-9007",

publisher = "American Physical Society",

number = "12",

}

TY - JOUR

T1 - Field calibration using the energy distribution of field ionization

AU - Sakurai, Toshio

AU - Müller, Erwin W.

PY - 1973

Y1 - 1973

N2 - The accuracy of data obtained by field-ion microscopy is often limited by a ± 15% uncertainty of converting measured voltages into field strengths. Plotting the difference of relative energy deficits of free-space ionized H2, D2, or Kr for sets of two applied voltages against the logarithm of the voltage ratios yields a field factor k. The surface field F0=Vkrt is obtained with the 3% accuracy by which the tip radius rt can be known. The method is applicable to all metals accessible to field-ion-microscopy.

AB - The accuracy of data obtained by field-ion microscopy is often limited by a ± 15% uncertainty of converting measured voltages into field strengths. Plotting the difference of relative energy deficits of free-space ionized H2, D2, or Kr for sets of two applied voltages against the logarithm of the voltage ratios yields a field factor k. The surface field F0=Vkrt is obtained with the 3% accuracy by which the tip radius rt can be known. The method is applicable to all metals accessible to field-ion-microscopy.

UR - http://www.scopus.com/inward/record.url?scp=35949031747&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=35949031747&partnerID=8YFLogxK

U2 - 10.1103/PhysRevLett.30.532

DO - 10.1103/PhysRevLett.30.532

M3 - Article

AN - SCOPUS:35949031747

VL - 30

SP - 532

EP - 535

JO - Physical Review Letters

JF - Physical Review Letters

SN - 0031-9007

IS - 12

ER -

Field calibration using the energy distribution of field ionization

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this