Field calibration using the energy distribution of field ionization

Toshio Sakurai; Erwin W. Müller

doi:10.1103/PhysRevLett.30.532

Field calibration using the energy distribution of field ionization

Toshio Sakurai, Erwin W. Müller

Research output: Contribution to journal › Article › peer-review

62 Citations (Scopus)

Abstract

The accuracy of data obtained by field-ion microscopy is often limited by a ± 15% uncertainty of converting measured voltages into field strengths. Plotting the difference of relative energy deficits of free-space ionized H2, D2, or Kr for sets of two applied voltages against the logarithm of the voltage ratios yields a field factor k. The surface field F0=Vkrt is obtained with the 3% accuracy by which the tip radius rt can be known. The method is applicable to all metals accessible to field-ion-microscopy.

Original language	English
Pages (from-to)	532-535
Number of pages	4
Journal	Physical Review Letters
Volume	30
Issue number	12
DOIs	https://doi.org/10.1103/PhysRevLett.30.532
Publication status	Published - 1973

ASJC Scopus subject areas

Physics and Astronomy(all)

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10.1103/PhysRevLett.30.532

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AB - The accuracy of data obtained by field-ion microscopy is often limited by a ± 15% uncertainty of converting measured voltages into field strengths. Plotting the difference of relative energy deficits of free-space ionized H2, D2, or Kr for sets of two applied voltages against the logarithm of the voltage ratios yields a field factor k. The surface field F0=Vkrt is obtained with the 3% accuracy by which the tip radius rt can be known. The method is applicable to all metals accessible to field-ion-microscopy.

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