FIELD CALIBRATION USING THE ENERGY DISTRIBUTION OF A FREE-SPACE FIELD IONIZATION.

Toshio Sakurai, Erwin W. Mueller

    Research output: Contribution to journalArticlepeer-review

    45 Citations (Scopus)

    Abstract

    Utilizing free-space field ionization, a new method of field calibration for field ion emitters has been developed. Plotting the differences of relative energy deficits of free-space ionized H//2, D//2, or Kr for sets of various applied voltages V against the logarithm of the voltage ratios yields a field factor k from which the surface field F//0 equals V/kr//t//i//p is obtained with 3% accuracy. Refinement of this method also enabled us to determine the local radii of the specimen tip. In addition to new and more reliable data of evaporation fields of various materials, such as W, Mo, Rh, Ir, Pt, and Ni, it has revealed several significant facts on the geometrical shape of the emitter. These results are relevant to field-ion microscopy.

    Original languageEnglish
    Pages (from-to)2618-2625
    Number of pages8
    JournalJournal of Applied Physics
    Volume48
    Issue number6
    DOIs
    Publication statusPublished - 1977 Jun

    ASJC Scopus subject areas

    • Physics and Astronomy(all)
    • Physics and Astronomy (miscellaneous)

    Fingerprint Dive into the research topics of 'FIELD CALIBRATION USING THE ENERGY DISTRIBUTION OF A FREE-SPACE FIELD IONIZATION.'. Together they form a unique fingerprint.

    Cite this