Ferromagnetic resonance linewidth for NM/80NiFe/NM films (NM = Cu, Ta, Pd and Pt)

S. Mizukami, Y. Ando, T. Miyazaki

Research output: Contribution to journalArticlepeer-review

143 Citations (Scopus)

Abstract

The out-of-plane angular dependence of ferromagnetic resonance linewidth of non-magnetic metal (NM)/ 80NiFe(Py)(20-100 A)/NM (NM = Cu, Ta, Pd and Pt) sputtered films were measured for the investigation of magnetic damping. The linewidth for NM = Pd and Pt were larger than that of NM = Cu and Ta. Analysis of the angular dependence of the linewidth using Landau-Lifshitz-Gilbert equation with magnetic inhomogeneities showed that the Gilbert damping parameter, G, for NM = Pt and Pd were larger than the bulk value of Py and were dependent on the thickness of Py. G, for NM = Cu and Ta were same as the bulk value. These results show that the magnetization precession of Py layers sandwiched by Pt or Pd layers damps more rapidly.

Original languageEnglish
Pages (from-to)1640-1642
Number of pages3
JournalJournal of Magnetism and Magnetic Materials
Volume226-230
Issue numberPART II
DOIs
Publication statusPublished - 2001

Keywords

  • Ferromagnetic resonance
  • Gilbert damping parameter
  • Linewidth
  • Permalloy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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