Ferroelectric properties of Ba2NaNb5O15 films by RF magnetron sputtering method

Yoichiro Masuda, Hiroshi Masumoto, Akira Baba, Yuuki Kidachi, Toshio Hirai

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

The deposition ratio (Ba : Na : Nb) of tungsten-bronze type thin film ferroelectrics depend on the sputtering conditions. The dielectric constant, dielectric loss factor are 889 and 0.029 at room temperature. The leakage current density is about 100 μ A/cm3 at 1MV/cm. The remanent polarization and coercive field are 2.39 μ C/cm2 and 87.33kV/cm, and the SHG coefficient d is about 2.51 × 10-13m/V, respectively.

Original languageEnglish
Pages (from-to)297-304
Number of pages8
JournalFerroelectrics
Volume195
Issue number1-4
DOIs
Publication statusPublished - 1997 Jan 1

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Ferroelectric properties of Ba<sub>2</sub>NaNb<sub>5</sub>O<sub>15</sub> films by RF magnetron sputtering method'. Together they form a unique fingerprint.

Cite this