TY - JOUR
T1 - Ferroelectric, electrical and magnetic properties of Cr, Mn, Co, Ni, Cu added polycrystalline BiFe O3 films
AU - Naganuma, Hiroshi
AU - Miura, Jun
AU - Okamura, Soichiro
N1 - Funding Information:
This study was partly supported by the Grant-in-Aid for Young Scientists B (Grant No. 20760474) from the Ministry of Education, Culture, Sports, Science and Technology, Japan. We wish to express gratitude to Professor Yoshihiko Hirotsu, Osaka University ISIR and Professor Nobuyuki Hiratsuka, Saitama University for using SQUID magnetometer and VSM.
PY - 2008
Y1 - 2008
N2 - Cr, Mn, Co, Ni, and Cu were added to polycrystalline BiFe O3 films, and their influence on the ferroelectric, electrical, and magnetic properties was investigated. All the additives except Ni reduced the leakage current density in the high electric field region. The addition of Cu and Co decreased the coercive field without reducing remanent polarization. The addition of Co caused spontaneous magnetization at room temperature, which exhibited a large coercive field of 16 kOe at 10 K. It was revealed that Co addition suppressed the leakage current density, decreased the electric coercive field, and induced spontaneous magnetization and large magnetic coercivity.
AB - Cr, Mn, Co, Ni, and Cu were added to polycrystalline BiFe O3 films, and their influence on the ferroelectric, electrical, and magnetic properties was investigated. All the additives except Ni reduced the leakage current density in the high electric field region. The addition of Cu and Co decreased the coercive field without reducing remanent polarization. The addition of Co caused spontaneous magnetization at room temperature, which exhibited a large coercive field of 16 kOe at 10 K. It was revealed that Co addition suppressed the leakage current density, decreased the electric coercive field, and induced spontaneous magnetization and large magnetic coercivity.
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U2 - 10.1063/1.2965799
DO - 10.1063/1.2965799
M3 - Article
AN - SCOPUS:51849100753
VL - 93
JO - Applied Physics Letters
JF - Applied Physics Letters
SN - 0003-6951
IS - 5
M1 - 052901
ER -