Femtosecond transient reflecting grating methods and analysis of the ultrafast carrier dynamics on Si(111) surfaces

Tomohiro Morishita, Akihide Hibara, Tsuguo Sawada, Isao Tsuyumoto, Akira Harata

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)

Abstract

The femtosecond transient reflecting grating (TRG) method was developed and applied to monitor the ultrafast dynamics of photo-excited carriers on Si(111) surfaces. TRG responses were measured as a function of the pump beam intensity and fringe spacing, and two relaxation components were observed. An analysis of the results has suggested that the slow component corresponds to carrier diffusion and that the fast component corresponds to a combined process between ballistic transport and carrier-carrier scattering of non- equilibrium carriers.

Original languageEnglish
Pages (from-to)403-406
Number of pages4
Journalanalytical sciences
Volume16
Issue number4
DOIs
Publication statusPublished - 2000 Apr
Externally publishedYes

ASJC Scopus subject areas

  • Analytical Chemistry

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