Feasibility of fault analysis based on intentional electromagnetic interference

Junko Takahashi, Yu-Ichi Hayashi, Naofumi Homma, Hitoshi Fuji, Takafumi Aoki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

This paper presents the feasibility of fault analysis using intentional electromagnetic interference (IEMI). Fault analysis (FA) is a kind of implementation attack that intentionally extracts a secret key embedded in a secure device such as a smart card. An attacker injects a computational fault during the cryptographic calculation and he can extract a secret key. Recently, Hayashi et al. showed that temporal faults could be remotely injected during the cryptographic calculation using IEMI. They showed a case study in which an Advanced Standard Encryption (AES) secret key could be extracted through fault analysis. However, the characteristics of faults that can be induced by IEMI were not described. And, a threat of various FAs was not clear. In this paper, we examine in detail how the IEMI fault injection affects the fault occurrence of intermediate states in a cryptographic module and investigate the distribution of the IEMI generated faults. Furthermore, we classify previous FAs with respect to an attack model such as the type of faults needed to achieve a successful attack, and discuss the feasibility of FAs using IEMI based on the experimental results.

Original languageEnglish
Title of host publicationEMC 2012 - 2012 IEEE International Symposium on Electromagnetic Compatibility, Final Program
Pages782-787
Number of pages6
DOIs
Publication statusPublished - 2012 Dec 12
Event2012 IEEE International Symposium on Electromagnetic Compatibility, EMC 2012 - Pittsburgh, PA, United States
Duration: 2012 Aug 52012 Aug 10

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Other

Other2012 IEEE International Symposium on Electromagnetic Compatibility, EMC 2012
CountryUnited States
CityPittsburgh, PA
Period12/8/512/8/10

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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