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Fast Scanning Method for Measuring Material Homogeneity using the Line-Focus-Beam Ultrasonic-Material-Characterization System
Yuji Ohashi, Yuui Yokota, Akihiro Yamaji, Masao Yoshino, Shunsuke Kurosawa, Kei Kamada, Hiroki Sato, Satoshi Toyoda, Akira Yoshikawa
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution