Fast Scanning Method for Measuring Material Homogeneity using the Line-Focus-Beam Ultrasonic-Material-Characterization System

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A new method for measuring material homogeneity using fast scanning technique was proposed and demonstrated with the line-focus-beam ultrasonic-material-characterization (LFB-UMC) system. Similar velocity profiles of leaky surface acoustic wave (LSAW) for a Ca3Ta(Ga0.75Al0.25)3Si2O14[CTGAS] single crystal specimen were successfully obtained by both of the new V(x) and the conventional V(z) methods. We have verified the new V(x) method was 56 times faster than the conventional V(z) method. Although the V(z) method is superior to the V(x) method in a viewpoint of measurement accuracy, the V(x) method has great advantage enabling us to quickly evaluate material homogeneity over the wide area of specimen.

Original languageEnglish
Title of host publicationIUS 2020 - International Ultrasonics Symposium, Proceedings
PublisherIEEE Computer Society
ISBN (Electronic)9781728154480
DOIs
Publication statusPublished - 2020 Sep 7
Event2020 IEEE International Ultrasonics Symposium, IUS 2020 - Las Vegas, United States
Duration: 2020 Sep 72020 Sep 11

Publication series

NameIEEE International Ultrasonics Symposium, IUS
Volume2020-September
ISSN (Print)1948-5719
ISSN (Electronic)1948-5727

Conference

Conference2020 IEEE International Ultrasonics Symposium, IUS 2020
CountryUnited States
CityLas Vegas
Period20/9/720/9/11

Keywords

  • Leaky surface acoustic wave (LSAW) velocity
  • Line-focus-beam ultrasonic material characterization (LFB-UMC) system
  • Measuring material homogeneity
  • V(z) curve analysis

ASJC Scopus subject areas

  • Acoustics and Ultrasonics

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