TY - GEN
T1 - Fast Scanning Method for Measuring Material Homogeneity using the Line-Focus-Beam Ultrasonic-Material-Characterization System
AU - Ohashi, Yuji
AU - Yokota, Yuui
AU - Yamaji, Akihiro
AU - Yoshino, Masao
AU - Kurosawa, Shunsuke
AU - Kamada, Kei
AU - Sato, Hiroki
AU - Toyoda, Satoshi
AU - Yoshikawa, Akira
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/9/7
Y1 - 2020/9/7
N2 - A new method for measuring material homogeneity using fast scanning technique was proposed and demonstrated with the line-focus-beam ultrasonic-material-characterization (LFB-UMC) system. Similar velocity profiles of leaky surface acoustic wave (LSAW) for a Ca3Ta(Ga0.75Al0.25)3Si2O14[CTGAS] single crystal specimen were successfully obtained by both of the new V(x) and the conventional V(z) methods. We have verified the new V(x) method was 56 times faster than the conventional V(z) method. Although the V(z) method is superior to the V(x) method in a viewpoint of measurement accuracy, the V(x) method has great advantage enabling us to quickly evaluate material homogeneity over the wide area of specimen.
AB - A new method for measuring material homogeneity using fast scanning technique was proposed and demonstrated with the line-focus-beam ultrasonic-material-characterization (LFB-UMC) system. Similar velocity profiles of leaky surface acoustic wave (LSAW) for a Ca3Ta(Ga0.75Al0.25)3Si2O14[CTGAS] single crystal specimen were successfully obtained by both of the new V(x) and the conventional V(z) methods. We have verified the new V(x) method was 56 times faster than the conventional V(z) method. Although the V(z) method is superior to the V(x) method in a viewpoint of measurement accuracy, the V(x) method has great advantage enabling us to quickly evaluate material homogeneity over the wide area of specimen.
KW - Leaky surface acoustic wave (LSAW) velocity
KW - Line-focus-beam ultrasonic material characterization (LFB-UMC) system
KW - Measuring material homogeneity
KW - V(z) curve analysis
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U2 - 10.1109/IUS46767.2020.9251779
DO - 10.1109/IUS46767.2020.9251779
M3 - Conference contribution
AN - SCOPUS:85097896592
T3 - IEEE International Ultrasonics Symposium, IUS
BT - IUS 2020 - International Ultrasonics Symposium, Proceedings
PB - IEEE Computer Society
T2 - 2020 IEEE International Ultrasonics Symposium, IUS 2020
Y2 - 7 September 2020 through 11 September 2020
ER -