Fast probe of local electronic states in nanostructures utilizing a single-lead quantum dot

Tomohiro Otsuka, Shinichi Amaha, Takashi Nakajima, Matthieu R. Delbecq, Jun Yoneda, Kenta Takeda, Retsu Sugawara, Giles Allison, Arne Ludwig, Andreas D. Wieck, Seigo Tarucha

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

Transport measurements are powerful tools to probe electronic properties of solid-state materials. To access properties of local electronic states in nanostructures, such as local density of states, electronic distribution and so on, micro-probes utilizing artificial nanostructures have been invented to perform measurements in addition to those with conventional macroscopic electronic reservoirs. Here we demonstrate a new kind of micro-probe: a fast single-lead quantum dot probe, which utilizes a quantum dot coupled only to the target structure through a tunneling barrier and fast charge readout by RF reflectometry. The probe can directly access the local electronic states with wide bandwidth. The probe can also access more electronic states, not just those around the Fermi level, and the operations are robust against bias voltages and temperatures.

Original languageEnglish
Article number14616
JournalScientific reports
Volume5
DOIs
Publication statusPublished - 2015 Sep 29
Externally publishedYes

ASJC Scopus subject areas

  • General

Fingerprint Dive into the research topics of 'Fast probe of local electronic states in nanostructures utilizing a single-lead quantum dot'. Together they form a unique fingerprint.

Cite this