Fast blotch detection algorithm for degraded film sequences based on MRF models

Sang Churl Nam, Masahide Abe, Masayuki Kawamata

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper proposes a fast blotch detection algorithm based on a Markov Random Field (MRF) model with less computational load and with lower false alarm rate than the existing MRF-based algorithms. The proposed algorithm can save the computational time for detecting the blotches by restricting the attention of the detection process only to the candidate areas. The experimental results show that our proposed method provides the computational simplicity and an efficient detecting performance for the blotches.

Original languageEnglish
Title of host publication2007 IEEE International Conference on Image Processing, ICIP 2007 Proceedings
PublisherIEEE Computer Society
Pages565-568
Number of pages4
ISBN (Print)1424414377, 9781424414376
DOIs
Publication statusPublished - 2006
Event14th IEEE International Conference on Image Processing, ICIP 2007 - San Antonio, TX, United States
Duration: 2007 Sep 162007 Sep 19

Publication series

NameProceedings - International Conference on Image Processing, ICIP
Volume3
ISSN (Print)1522-4880

Other

Other14th IEEE International Conference on Image Processing, ICIP 2007
Country/TerritoryUnited States
CitySan Antonio, TX
Period07/9/1607/9/19

Keywords

  • Image processing
  • Image restoration

ASJC Scopus subject areas

  • Engineering(all)

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