TY - GEN
T1 - Fabrication process dependency of dosimetric and scintillation properties of sapphire crystals
AU - Fujimoto, Yutaka
AU - Yanagida, Takayuki
AU - Futami, Yoshisuke
PY - 2013/1/1
Y1 - 2013/1/1
N2 - Dosimetric, and scintillation properties of undoped sapphire (Al 2O3) single crystal fabricated by different methods of the Czochralski (Cz) and the Bridgman were investigated. In X-ray induced radioluminescence spectra, they showed emission peaks at 240 and 300 nm due to exciton and F+ centers, respectively. Scintillation decay times of F+ center was fast around few ns. As a dosimetric property, from 0.01 to 2 Gy X-ray was exposed to them and they exhibited a thermally stimulated luminescence (TSL) with a good linearity. The glow peaks of them were similar, 150, 250, and 325 °C. In TSL, the Bridgeman sample represented only F-center emission while the Cz sample showed F at 400 nm and F+ at 300 nm centers emission.
AB - Dosimetric, and scintillation properties of undoped sapphire (Al 2O3) single crystal fabricated by different methods of the Czochralski (Cz) and the Bridgman were investigated. In X-ray induced radioluminescence spectra, they showed emission peaks at 240 and 300 nm due to exciton and F+ centers, respectively. Scintillation decay times of F+ center was fast around few ns. As a dosimetric property, from 0.01 to 2 Gy X-ray was exposed to them and they exhibited a thermally stimulated luminescence (TSL) with a good linearity. The glow peaks of them were similar, 150, 250, and 325 °C. In TSL, the Bridgeman sample represented only F-center emission while the Cz sample showed F at 400 nm and F+ at 300 nm centers emission.
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U2 - 10.1109/NSSMIC.2013.6829629
DO - 10.1109/NSSMIC.2013.6829629
M3 - Conference contribution
AN - SCOPUS:84904177291
SN - 9781479905348
T3 - IEEE Nuclear Science Symposium Conference Record
BT - 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2013 60th IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013
Y2 - 27 October 2013 through 2 November 2013
ER -