Fabrication process dependency of dosimetric and scintillation properties of sapphire crystals

Yutaka Fujimoto, Takayuki Yanagida, Yoshisuke Futami

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Dosimetric, and scintillation properties of undoped sapphire (Al 2O3) single crystal fabricated by different methods of the Czochralski (Cz) and the Bridgman were investigated. In X-ray induced radioluminescence spectra, they showed emission peaks at 240 and 300 nm due to exciton and F+ centers, respectively. Scintillation decay times of F+ center was fast around few ns. As a dosimetric property, from 0.01 to 2 Gy X-ray was exposed to them and they exhibited a thermally stimulated luminescence (TSL) with a good linearity. The glow peaks of them were similar, 150, 250, and 325 °C. In TSL, the Bridgeman sample represented only F-center emission while the Cz sample showed F at 400 nm and F+ at 300 nm centers emission.

Original languageEnglish
Title of host publication2013 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781479905348
DOIs
Publication statusPublished - 2013 Jan 1
Externally publishedYes
Event2013 60th IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013 - Seoul, Korea, Republic of
Duration: 2013 Oct 272013 Nov 2

Publication series

NameIEEE Nuclear Science Symposium Conference Record
ISSN (Print)1095-7863

Other

Other2013 60th IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013
CountryKorea, Republic of
CitySeoul
Period13/10/2713/11/2

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Radiology Nuclear Medicine and imaging

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  • Cite this

    Fujimoto, Y., Yanagida, T., & Futami, Y. (2013). Fabrication process dependency of dosimetric and scintillation properties of sapphire crystals. In 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013 [6829629] (IEEE Nuclear Science Symposium Conference Record). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NSSMIC.2013.6829629