Fabrication of silicon nanowire probe with magnet for magnetic resonance force microscopy

Yong Jun Seo, Masaya Toda, Yusuke Kawai, Takahito Ono

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

Silicon nanowires have attracted considerable attention due to their excellent mechanical and electrical properties and widely investigated for various applications. One of the exciting applications is magnetic resonance force microscopy (MRFM), which requires a high sensitive probe for three-dimensional imaging of spin densities. In this study, we have fabricated a 160 nm-wide and 52 μm-long Si nanowire probe with a Si mirror and Ni magnet from a silicon-on-insulator wafer. The nanowire is suitable structure as the probe for a detection of MRFM. The probe shows a resonance frequency of 8.007 kHz and a Q factor of approximately 5000. Two-dimensional force mapping based on electron spin resonance has been demonstrated using the fabricated nanowire probe.

Original languageEnglish
Pages (from-to)166-167
Number of pages2
JournalIEEJ Transactions on Sensors and Micromachines
Volume134
Issue number6
DOIs
Publication statusPublished - 2014

Keywords

  • Force detection
  • Force map
  • MRFM
  • Si nanowire probe

ASJC Scopus subject areas

  • Mechanical Engineering
  • Electrical and Electronic Engineering

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