Fabrication of nickel/organic-molecule/nickel nanoscale junctions utilizing thin-film edges and their structural and electrical properties

Hideo Kaiju, Kenji Kondo, Nubla Basheer, Nobuyoshi Kawaguchi, Susanne White, Akihiko Hirata, Manabu Ishimaru, Yoshihiko Hirotsu, Akira Ishibashi

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Metal/organic-molecule/metal nanoscale junctions, which consist of poly(3-hexylthiophene):6,6-phenyl C61-butyric acid methyl ester (P3HT:PCBM) organic molecules sandwiched between two Ni thin films whose edges are crossed, which are called quantum cross (QC) devices, have been fabricated and their structural and electrical properties have been investigated. The area of the crossed section, which was obtained without using electron-beam or optical lithography, can be as small as 16 × 16nm 2. We have obtained ohmic current-voltage characteristics, which show quantitative agreement with the theoretical calculation results performed within the framework of the Anderson model under the strong coupling limit. Calculation results also predict that a high on-off ratio beyond 100000 : 1 can be obtained in Ni/P3HT:PCBM/Ni QC devices under the weak coupling condition. These results indicate that our method utilizing thin-film edges is useful for creating nanoscale junctions and Ni/P3HT:PCBM/Ni QC devices can be expected to have potential application in next-generation switching devices with high on-off ratios.

Original languageEnglish
Article number065202
JournalJapanese journal of applied physics
Volume51
Issue number6 PART 1
DOIs
Publication statusPublished - 2012 Jun 1

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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    Kaiju, H., Kondo, K., Basheer, N., Kawaguchi, N., White, S., Hirata, A., Ishimaru, M., Hirotsu, Y., & Ishibashi, A. (2012). Fabrication of nickel/organic-molecule/nickel nanoscale junctions utilizing thin-film edges and their structural and electrical properties. Japanese journal of applied physics, 51(6 PART 1), [065202]. https://doi.org/10.1143/JJAP.51.065202