Abstract
We propose using a multiple slit fabricated by a simple and economical stacked-sliced method for X-ray phase imaging with a Talbot-Lau X-ray interferometer. Foils of Ta and Al were stacked alternately, and the stack was sliced up perpendicular to the stacking direction. We successfully fabricated a hard X-ray multiple slit with a space size (Al foil thickness) of about 10μm and an aspect ratio of 60. Optical microscopy evaluation showed its regular pitch pattern at its surface. A high-resolution X-ray transmission image proved the regularity of the inner part. The visibility of moiré fringes and the phase-contrast image obtained using the Talbot-Lau interferometer with the multiple slit proved the feasibility of the stacked-sliced approach.
Original language | English |
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Pages (from-to) | 7412-7414 |
Number of pages | 3 |
Journal | Japanese journal of applied physics |
Volume | 47 |
Issue number | 9 PART 1 |
DOIs | |
Publication status | Published - 2008 Sep 12 |
Externally published | Yes |
Keywords
- Grating
- Multiple silt
- Phase contrast
- Talbot-Lau interferometry
- X-ray
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)