Fabrication of a 3000-6-input-LUTs embedded and block-level power-gated nonvolatile FPGA chip using p-MTJ-based logic-in-memory structure

D. Suzuki, M. Natsui, A. Mochizuki, S. Miura, H. Honjo, H. Sato, S. Fukami, S. Ikeda, T. Endoh, H. Ohno, T. Hanyu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

16 Citations (Scopus)

Abstract

A nonvolatile FPGA (NVFPGA) test chip, where 3000 6-input lookup table (LUT) circuits are embedded, is fabricated under 90nm CMOS/75nm perpendicular magnetic tunnel junction (p-MTJ) technologies. The use of a p-MTJ device makes data-backup-limitation free, which essentially eliminates damage control to nonvolatile storage devices. The use of a p-MTJ device also enables the extension towards dynamically reconfigurable logic paradigm. Since hardware components are shared among all the p-MTJ devices by the use of logic-in-memory structure, the effective area of the 6-input LUT circuit is reduced by 56% compared to that of an SRAM-based one. Moreover, block-level power gating, in which all the idle function blocks are optimally turned off in accordance with the operation mode, can minimize static power consumption of each tile. As a result, the total average power of the proposed NVFPGA is reduced by 81% in comparison with that of an SRAM-based FPGA under typical benchmark-circuit realizations.

Original languageEnglish
Title of host publication2015 Symposium on VLSI Circuits, VLSI Circuits 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
PagesC172-C173
ISBN (Electronic)9784863485020
DOIs
Publication statusPublished - 2015 Aug 31
Event29th Annual Symposium on VLSI Circuits, VLSI Circuits 2015 - Kyoto, Japan
Duration: 2015 Jun 172015 Jun 19

Publication series

NameIEEE Symposium on VLSI Circuits, Digest of Technical Papers
Volume2015-August

Other

Other29th Annual Symposium on VLSI Circuits, VLSI Circuits 2015
Country/TerritoryJapan
CityKyoto
Period15/6/1715/6/19

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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