Fabrication and evaluation of one-axis oriented lead zirconate titanate films using metal-oxide nanosheet interface layer

Yoshiki Minemura, Kohei Nagasaka, Takanori Kiguchi, Toyohiko J. Konno, Hiroshi Funakubo, Hiroshi Uchida

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

Abstract

Nanosheet Ca2Nb3O20 (ns-CN) layers with pseudo-perovskite-type crystal configuration were applied on the surface of polycrystalline metal substrates to achieve preferential crystal orientation of Pb(Zr,Ti)O3 (PZT) films for the purpose of enhanced ferroelectricity comparable to that of epitaxial thin films. PZT films with tetragonal symmetry (Zr/Ti = 0.40 : 0.60) were fabricated by chemical solution deposition (CSD) on ns-CNbuffered Inconel 625 and SUS 316L substrates, while ns-CN was applied on the the substrates by dip-coating. The preferential crystal growth on the ns-CN layer can be achieved by favorable lattice matching between (001)/(100)PZT and (001)ns-CN planes. The degree of (001) orientation was increased for PZT films on ns-CN/Inconel 625 and ns-CN/SUS 316L substrates, whereas randomly-oriented PZT films with a lower degree of (001) orientation were grown on bare and Inconel 625 films. Enhanced remanent polarization of 60 μC/cm2 was confirmed for the PZT films on ns-CN/metal substrates, ascribed to the preferential alignment of the polar [001] axis normal to the substrate surface, although it also suffered from higher coercive field above 500 kV/cm caused by PZT/metal interfacial reaction.

Original languageEnglish
Article number09KA04
JournalJapanese journal of applied physics
Volume52
Issue number9 PART2
DOIs
Publication statusPublished - 2013 Sep

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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