Extended X-ray emission fine structure of sodium

Jun Kawai, Kouichi Hayashi, Shigeo Tanuma

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)

Abstract

Sodium X-ray emission spectra of NaCl powder were measured by wavelength-dispersive X-ray fluorescence spectrometry and electron probe microanalysis. The X-ray emission spectra show an oscillating fine structure similar to that of the extended X-ray absorption fine structure (EXAFS). The Fourier transform of the X-ray fluorescence spectrum shows a similar radial distribution of atoms around the sodium. These findings demonstrate that a wavelength-dispersive X-ray emission spectrometer is a powerful tool for analyzing the local structure around a light element in condensed matter, which is still not an easy task with using a third-generation synchrotron radiation facility.

Original languageEnglish
Pages (from-to)617-619
Number of pages3
JournalAnalyst
Volume123
Issue number4
DOIs
Publication statusPublished - 1998 Apr

Keywords

  • Amorphous
  • Electron probe microanalysis
  • Extended X-ray emission fine structure
  • Sodium K edge
  • Structure analysis
  • Wavelength-dispersive X-ray fluorescence

ASJC Scopus subject areas

  • Analytical Chemistry
  • Biochemistry
  • Environmental Chemistry
  • Spectroscopy
  • Electrochemistry

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