Abstract
Sodium X-ray emission spectra of NaCl powder were measured by wavelength-dispersive X-ray fluorescence spectrometry and electron probe microanalysis. The X-ray emission spectra show an oscillating fine structure similar to that of the extended X-ray absorption fine structure (EXAFS). The Fourier transform of the X-ray fluorescence spectrum shows a similar radial distribution of atoms around the sodium. These findings demonstrate that a wavelength-dispersive X-ray emission spectrometer is a powerful tool for analyzing the local structure around a light element in condensed matter, which is still not an easy task with using a third-generation synchrotron radiation facility.
Original language | English |
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Pages (from-to) | 617-619 |
Number of pages | 3 |
Journal | Analyst |
Volume | 123 |
Issue number | 4 |
DOIs | |
Publication status | Published - 1998 Apr |
Keywords
- Amorphous
- Electron probe microanalysis
- Extended X-ray emission fine structure
- Sodium K edge
- Structure analysis
- Wavelength-dispersive X-ray fluorescence
ASJC Scopus subject areas
- Analytical Chemistry
- Biochemistry
- Environmental Chemistry
- Spectroscopy
- Electrochemistry