Extended X-ray emission fine structure (EXEFS)

J. Kawai, K. Hayashi

Research output: Contribution to journalArticlepeer-review

22 Citations (Scopus)

Abstract

We show that a similar structure to the extended X-ray absorption fine structure (EXAFS) is observable in the line shape of X-ray fluorescence spectra. Using this similarity, we can measure the soft X-ray EXAFS using a hard X-ray beam line. The incident beam energy is required only to be high enough to excite the characteristic X-ray line. Therefore a monochromatized incident beam is not required. Measurement of the Al K-edge EXAFS of AlN excited by X-rays from an Rh anode X-ray tube using this method is described as an example.

Original languageEnglish
Pages (from-to)243-245
Number of pages3
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume92
Issue number1-3
DOIs
Publication statusPublished - 1998 May

Keywords

  • AlN
  • Crystal structure
  • EXAFS
  • X-ray spectroscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Radiation
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Spectroscopy
  • Physical and Theoretical Chemistry

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