Abstract
We show that a similar structure to the extended X-ray absorption fine structure (EXAFS) is observable in the line shape of X-ray fluorescence spectra. Using this similarity, we can measure the soft X-ray EXAFS using a hard X-ray beam line. The incident beam energy is required only to be high enough to excite the characteristic X-ray line. Therefore a monochromatized incident beam is not required. Measurement of the Al K-edge EXAFS of AlN excited by X-rays from an Rh anode X-ray tube using this method is described as an example.
| Original language | English |
|---|---|
| Pages (from-to) | 243-245 |
| Number of pages | 3 |
| Journal | Journal of Electron Spectroscopy and Related Phenomena |
| Volume | 92 |
| Issue number | 1-3 |
| DOIs | |
| Publication status | Published - 1998 May |
Keywords
- AlN
- Crystal structure
- EXAFS
- X-ray spectroscopy
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Radiation
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Spectroscopy
- Physical and Theoretical Chemistry