TY - JOUR
T1 - Extended fine structure in characteristic X-ray fluorescence
T2 - A novel structural analysis method of condensed systems
AU - Hayashi, Kouichi
AU - Kawai, Jun
AU - Awakura, Yasuhiro
N1 - Funding Information:
The authorsw ould like to thank Dr. K. Maeda (RIKEN) for fruitful discussion.T his work was supportedin part by a Grant-in-Aid for Scientific Researchf rom the Ministry of Education,S cience andC ulture,J apan.
Copyright:
Copyright 2017 Elsevier B.V., All rights reserved.
PY - 1997/12/19
Y1 - 1997/12/19
N2 - An oscillation similar to that in extended X-ray absorption fine structure (EXAFS) is found in characteristic X-ray fluorescence spectra, originating from a quantum interference effect during the X-ray emission process in a solid. We observe the oscillating fine structure in the radiative Auger X-ray fluorescence spectra of aluminum metal. The A1-A1 interatomic distances are successfully reproduced by the Fourier transform of the fine structure. Thus, the present method has the potential to become a convenient alternative to EXAFS measurement for light elements.
AB - An oscillation similar to that in extended X-ray absorption fine structure (EXAFS) is found in characteristic X-ray fluorescence spectra, originating from a quantum interference effect during the X-ray emission process in a solid. We observe the oscillating fine structure in the radiative Auger X-ray fluorescence spectra of aluminum metal. The A1-A1 interatomic distances are successfully reproduced by the Fourier transform of the fine structure. Thus, the present method has the potential to become a convenient alternative to EXAFS measurement for light elements.
KW - EXAFS
KW - Soft X-ray
KW - X-ray fluorescence (XRF)
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U2 - 10.1016/S0584-8547(97)00097-9
DO - 10.1016/S0584-8547(97)00097-9
M3 - Article
AN - SCOPUS:0031357721
VL - 52
SP - 2169
EP - 2172
JO - Spectrochimica Acta - Part B Atomic Spectroscopy
JF - Spectrochimica Acta - Part B Atomic Spectroscopy
SN - 0584-8547
IS - 14
ER -