Extended fine structure in characteristic X-ray fluorescence: A novel structural analysis method of condensed systems

Kouichi Hayashi, Jun Kawai, Yasuhiro Awakura

Research output: Contribution to journalArticlepeer-review

18 Citations (Scopus)

Abstract

An oscillation similar to that in extended X-ray absorption fine structure (EXAFS) is found in characteristic X-ray fluorescence spectra, originating from a quantum interference effect during the X-ray emission process in a solid. We observe the oscillating fine structure in the radiative Auger X-ray fluorescence spectra of aluminum metal. The A1-A1 interatomic distances are successfully reproduced by the Fourier transform of the fine structure. Thus, the present method has the potential to become a convenient alternative to EXAFS measurement for light elements.

Original languageEnglish
Pages (from-to)2169-2172
Number of pages4
JournalSpectrochimica Acta - Part B Atomic Spectroscopy
Volume52
Issue number14
DOIs
Publication statusPublished - 1997 Dec 19

Keywords

  • EXAFS
  • Soft X-ray
  • X-ray fluorescence (XRF)

ASJC Scopus subject areas

  • Analytical Chemistry
  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Spectroscopy

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