Extended data retention characteristics after more than 104 write and erase cycles in EEPROMs

S. Aritome, R. Kirisawa, T. Endoh, R. Nakayama, R. Shirota, K. Sakui, K. Ohuchi, F. Masuoka

Research output: Contribution to journalConference articlepeer-review

17 Citations (Scopus)

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Engineering & Materials Science